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Kitmap showcases a wide range of advanced Scientific infrastructure and resources available for R&D and innovation in New Zealand.

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The Latest Infrastructure and Resources

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Bruker Icon IR

Atomic Force Microscope (AFM) - Bruker Dimension IconIR

Bruker’s large-sample Dimension IconIR is a combined nanoscale infrared (IR) spectroscopy and scanning probe microscope (SPM) system that combines spectroscopy, imaging, and property mapping performance on a single platform.

Webpage: https://profiles.canterbury.ac.nz/equipment/388838

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Resource
it 300

Variable Pressure Scanning Electron Microscope (SEM) - JEOL JSM IT300LV

UC’s JEOL JSM‑IT300 is a versatile LaB₆‑source analytical SEM that supports high‑quality imaging and microanalysis across materials, geological, environmental, and engineered samples. Its thermal‑emission LaB₆ filament, multi‑detector configuration, and low‑vacuum capability make it a robust workhorse for routine and advanced characterisation, especially where compositional mapping and crystallographic analysis are required

Webpage: hhttps://profiles.canterbury.ac.nz/equipment/388835

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Resource
tescan clara

Ultra High Resolution Scanning Electron Microscope (SEM) - Tescan Clara

UC’s Tescan Clara Ultra‑High‑Resolution Scanning Electron Microscope (UHR‑SEM) provides field‑free, nanoscale analytical imaging for materials, surfaces, and engineered structures.

Webpage: https://profiles.canterbury.ac.nz/equipment/381730

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